|
Computational Storage for 3D NAND Flash Error Recovery Flow Prediction
Zambelli, C.; Miola, A.; Calore, E.; Micheloni, R.; Schifano, S. F.
dettagli >>
|
Springer Science and Business Media Deutschland GmbH,
Lecture Notes in Electrical Engineering
Vol. 1113, No. 1, pp: 425-435, Anno: 2024 |
|
|
|
|
Technology-Aware Drift Resilience Analysis of RRAM Crossbar Array Configurations
Reiser, D.; Reichenbach, M.; Rizzi, T.; Baroni, A.; Fritscher, M.; Wenger, C.; Zambelli, C.; Bertozzi, D.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings
pp: 1-5, Anno: 2023 |
|
|
|
|
Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND
Pesic, M.; Beltrando, B.; Rollo, T.; Zambelli, C.; Padovani, A.; Micheloni, R.; Maji, R.; Enman, L.; Saly, M.; Bae, Y. H.; Kim, J. B.; Yim, D. K.; Larcher, L.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2023-, No. 1, pp: 1-8, Anno: 2023 |
|
|
|
|
On the Reliability of RRAM-Based Neural Networks
Aziza, H.; Zambelli, C.; Hamdioui, S.; Diware, S.; Bishnoi, R.; Gebregiorgis, A.
dettagli >>
|
IEEE Computer Society,
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
pp: 1-8, Anno: 2023 |
|
|
|
|
Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs
Rizzi, T.; Baroni, A.; Glukhov, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
Vol. 2022-, No. 1, pp: 1-5, Anno: 2022 |
|
|
|
|
End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays
Glukhov, A; Lepri, N; Milo, V; Baroni, A; Zambelli, C; Olivo, P; Perez, E; Wenger, C; Ielmini, D
dettagli >>
|
IEEE Computer Society,
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
pp: 1-5, Anno: 2022 |
|
|
|
|
Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators
Glukhov, A.; Milo, V.; Baroni, A.; Lepri, N.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2022-, No. 1, pp: 31-37, Anno: 2022 |
|
|
|
|
Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory
Mannocci, P.; Baroni, A.; Melacarne, E.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
Proceedings - IEEE International Symposium on Circuits and Systems
Vol. 2022, No. 1, pp: 326-330, Anno: 2022 |
|
|
|
|
Optimized programming algorithms for multilevel RRAM in hardware neural networks
Milo, V.; Anzalone, F.; Zambelli, C.; Perez, E.; Mahadevaiah, M. K.; Ossorio, O. G.; Olivo, P.; Wenger, C.; Ielmini, D.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2021, No. 1, pp: 1-6, Anno: 2021 |
|
|
|
|
Comparative Analysis and Optimization of the SystemC-AMS Analog Simulation Efficiency of Resistive Crossbar Arrays
Rizzi, T.; Quesada, E. P. -B.; Wenger, C.; Zambelli, C.; Bertozzi, D.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
2021 XXXVI Conference on Design of Circuits and Integrated Systems (DCIS)
pp: 183-188, Anno: 2021 |
|
|
|
|
Dynamic VTH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash
Zambelli, C.; Ferro, E.; Crippa, L.; Micheloni, R.; Olivo, P.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
2019 IEEE International Integrated Reliability Workshop (IIRW)
Vol. 2019, No. 1, pp: 8989886-1-8989886-4, Anno: 2019 |
|
|
|
|
Reliability challenges in 3D NAND Flash memories
Zambelli, C.; Micheloni, R.; Olivo, P.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
2019 IEEE 11th International Memory Workshop, IMW 2019
pp: 1-8739741-4, Anno: 2019 |
|
|
|
|
Low-energy inference machine with multilevel HfO2 RRAM arrays
Milo, V.; Zambelli, C.; Olivo, P.; Perez, E.; Ossorio, O. G.; Wenger, C.; Ielmini, D.
dettagli >>
|
IEEE,
European Solid-State Device Research Conference
Vol. 2019, No. 1, pp: 174-177, Anno: 2019 |
|
|
|
|
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing
Mahadevaiah, M. K.; Perez, E.; Wenger, C.; Grossi, A.; Zambelli, C.; Olivo, P.; Zahari, F.; Kohlstedt, H.; Ziegler, M.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2019, No. March, pp: 8720552-1-8720552-4, Anno: 2019 |
|
|
|
|
IIRW 2019 Discussion Group II: Reliability for Aerospace Applications
Scharlotta, J. -Y.; Kotov, A.; Zambelli, C.; Guarin, F.; Puglisi, F. M.; Ostermaier, C.; Bersuker, G.; Tyagnoy, S.; Young, C.; Haase, G.; Rzepa, G.; Waltl, M.; Chohan, T.; Iyer, S.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
Vol. 2019, No. 1, pp: 1-4, Anno: 2019 |
|
|
|
|
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs
Zambelli, Cristian; Castellari, Marco; Olivo, Piero; Bertozzi, Davide
dettagli >>
|
IEEE,
2018 New Generation of CAS (NGCAS)
pp: 21-24, Anno: 2018 |
|
|
|
|
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories
Zambelli, Cristian; Crippa, Luca; Micheloni, Rino; Olivo, Piero
dettagli >>
|
IEEE,
2018 International Integrated Reliability Workshop (IIRW)
Vol. 2018-, No. 1, pp: 44-47, Anno: 2018 |
|
|
|
|
Temperature impact and programming algorithm for RRAM based memories
Pérez, E.; Grossi, A.; Zambelli, C.; Mahadevaiah, M. K.; Olivo, P.; Wenger, Ch.
dettagli >>
|
Institute of Electrical and Electronics Engineers Inc.,
2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2018
pp: 1-3, Anno: 2018 |
|
|
|
|
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices
Perez, Eduardo; Mahadevaiah, Mamathamba Kalishettyhalli; Wenger, Christian; Zambelli, Cristian; Olivo, Piero
dettagli >>
|
IEEE,
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
pp: 37-40, Anno: 2018 |
|
|
|
|
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization
Zambelli, Cristian; Cancelliere, Giuseppe; Riguzzi, Fabrizio; Lamma, Evelina; Olivo, Piero; Marelli, Alessia; Micheloni, Rino
dettagli >>
|
IEEE,
Memory Workshop (IMW), 2017 IEEE International
pp: 1-4, Anno: 2017 |
|
|
|